STUDIES OF TEXTURE IN THIN-FILMS USING SYNCHROTRON RADIATION AND ENERGY DISPERSIVE DIFFRACTION

被引：5

作者：

HART, M

PARRISH, W

MASCIOCCHI, N

机构：

[1] IBM CORP,ALMADEN RES CTR,SAN JOSE,CA 95120

[2] IST STRUTTURIST CHIM INORGAN,I-20143 MILANO,ITALY

来源：

APPLIED PHYSICS LETTERS | 1987年 / 50卷 / 14期

关键词：

D O I：

10.1063/1.98026

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：897 / 899

页数：3

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