STUDIES OF TEXTURE IN THIN-FILMS USING SYNCHROTRON RADIATION AND ENERGY DISPERSIVE DIFFRACTION

被引：5
|
作者：
HART, M
PARRISH, W
MASCIOCCHI, N
机构：
[1] IBM CORP,ALMADEN RES CTR,SAN JOSE,CA 95120
[2] IST STRUTTURIST CHIM INORGAN,I-20143 MILANO,ITALY
来源：
APPLIED PHYSICS LETTERS | 1987年 / 50卷 / 14期
关键词：
D O I：
10.1063/1.98026
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：897 / 899
页数：3
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