FROZEN LIQUID CRACKING METHOD FOR HIGH-RESOLUTION SCANNING ELECTRON-MICROSCOPY

被引：0
|
作者：
HAMANO, M
OTAKA, T
NAGATANI, T
TANAKA, K
机构：
[1] HITACHI LTD,NAKA WORKS,SCI INSTR APPL LAB,NAKA,IBARAKI,JAPAN
[2] TOTTORI UNIV,SCH MED,DEPT ANAT,TOTTORI CITY,TOTTORI,JAPAN
来源：
JOURNAL OF ELECTRON MICROSCOPY | 1973年 / 22卷 / 03期
关键词：
D O I：
暂无
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
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页码：298 / 298
页数：1
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