共 12 条
- [5] BACKGROUND CORRECTIONS FOR QUANTITATIVE ELECTRON-MICROPROBE ANALYSIS USING A LITHIUM DRIFTED SILICON X-RAY DETECTOR JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1973, 6 (03): : 286 - 288
- [6] ELECTRON-PROBE ANALYSIS OF OLIVINES USING CALIBRATION CURVES BULLETIN DE LA SOCIETE FRANCAISE MINERALOGIE ET DE CRISTALLOGRAPHIE, 1969, 92 (05): : 447 - &
- [8] QUANTITATIVE-ANALYSIS OF STEEL SHEET SURFACES USING COMPUTER-AIDED ELECTRON-PROBE MICROANALYSIS FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1989, 333 (4-5): : 441 - 446
- [9] QUANTITATIVE-ANALYSIS OF DOPANTS IN SILICON BY ELECTRON AUGER-SPECTROSCOPY AND ELECTRON-PROBE MICROANALYSIS SOVIET MICROELECTRONICS, 1985, 14 (01): : 41 - 44