COHESIVE ENERGY OF 2-DIMENSIONAL SI(111)-3 X 1 AG AND SI(111)SQUARE ROOT 3-R(30-DEGREES)AG PHASES OF SILVER (DEPOSIT)-SILICON(111) (SUBSTRATE) SYSTEM

被引:164
|
作者
LELAY, G
MANNEVILLE, M
KERN, R
机构
关键词
D O I
10.1016/0039-6028(78)90304-7
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
引用
收藏
页码:405 / 422
页数:18
相关论文
共 50 条
  • [41] RHEED INTENSITY ANALYSIS OF SI(111) SQUARE-ROOT-3 X SQUARE-ROOT-3-AG STRUCTURE
    ICHIMIYA, A
    KOHMOTO, S
    FUJII, T
    HORIO, Y
    APPLIED SURFACE SCIENCE, 1989, 41-2 : 82 - 87
  • [42] HYDROGEN-INDUCED REORDERING OF THE SI(111)-SQUARE-ROOT-3-X-SQUARE-ROOT-3-AG SURFACE
    OURA, K
    NAITOH, M
    YAMANE, J
    SHOJI, F
    SURFACE SCIENCE, 1990, 230 (1-3) : L151 - L154
  • [43] Electronic structure study of ultrathin Ag(111) films modified by a Si(111) substrate and √3 x √3-Ag2Bi surface
    Ogawa, M.
    Sheverdyaeva, P. M.
    Moras, P.
    Topwal, D.
    Harasawa, A.
    Kobayashi, K.
    Carbone, C.
    Matsuda, I.
    JOURNAL OF PHYSICS-CONDENSED MATTER, 2012, 24 (11)
  • [44] Simultaneous noncontact AFM and STM of Ag:Si(111)-(√3 x √3)R30°
    Sweetman, Adam
    Stannard, Andrew
    Sugimoto, Yoshiaki
    Abe, Masayuki
    Morita, Seizo
    Moriarty, Philip
    PHYSICAL REVIEW B, 2013, 87 (07)
  • [45] Atomic structure of Si(111) √3×√3R30°-Ag surface
    Jia, Jinfeng
    Zhao, Ruguang
    Yang, Weisheng
    Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors, 1993, 14 (01): : 60 - 65
  • [46] GEOMETRIC STRUCTURE OF THE SI(111)-(SQUARE-ROOT-3 X SQUARE-ROOT-3)R30-DEGREES-AU SURFACE
    CHESTER, M
    GUSTAFSSON, T
    SURFACE SCIENCE, 1991, 256 (1-2) : 135 - 146
  • [47] HIGH-RESOLUTION PHOTOELECTRON-SPECTROSCOPY STUDY OF (ROOT-3X-ROOT-3) R30-DEGREES-AG ON SI(111)
    HERMAN, GS
    WOICIK, JC
    ANDREWS, AB
    ERSKINE, JL
    SURFACE SCIENCE, 1993, 290 (1-2) : L643 - L648
  • [48] THERMAL DISORDERING OF THE (SQUARE-ROOT 3 X SQUARE-ROOT 3)R30-DEGREES STRUCTURE OF AL ON SI(111)
    HWANG, RQ
    WILLIAMS, ED
    PARK, RL
    SURFACE SCIENCE, 1988, 193 (1-2) : L53 - L57
  • [49] Low-temperature reconstruction pathway to the Si(111)(root 3x root 3)R30 degrees-Ag interface
    Carpinelli, JM
    Weitering, HH
    PHYSICAL REVIEW B, 1996, 53 (19): : 12651 - 12654
  • [50] A SCANNED-ANGLE AND SCANNED-ENERGY PHOTOELECTRON DIFFRACTION STUDY OF (ROOT-3X-ROOT-3)R30-DEGREES AG ON SI(111)
    HERMAN, GS
    BULLOCK, EL
    YAMADA, M
    KADUWELA, AP
    FRIEDMAN, DJ
    THEVUTHASAN, S
    KIM, YJ
    TRAN, TT
    FADLEY, CS
    LINDNER, T
    RICKEN, DE
    ROBINSON, AW
    BRADSHAW, AM
    SURFACE SCIENCE, 1993, 284 (1-2) : 23 - 52