Application of the electron microscope to the study of photographic phenomena

被引：35

作者：

Hall, CE ^{[1
]}

Schoen, AL ^{[1
]}

机构：

[1] Eastman Kodak Co, Rochester, NY USA

来源：

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA | 1941年 / 31卷 / 04期

关键词：

D O I：

10.1364/JOSA.31.000281

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：281 / 285

页数：5

共 50 条

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