LONG WAVELENGTH PHOTOEFFECTS IN MERCURY SELENIDE, MERCURY TELLURIDE, AND MERCURY TELLURIDE CADMIUM TELLURIDE

被引：27
|
作者：
KRUSE, PW
BLUE, MD
GARFUNKEL, JH
SAUR, WD
机构：
来源：
INFRARED PHYSICS | 1962年 / 2卷 / 01期
关键词：
D O I：
10.1016/0020-0891(62)90043-X
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：53 / 60
页数：8
相关论文
共 50 条
  • [21] THE BONDING PROPERTIES OF MERCURY CADMIUM TELLURIDE
    HARRISON, WA
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1983, 1 (03): : 1672 - 1673
  • [22] SATURABLE TRANSMISSION IN MERCURY CADMIUM TELLURIDE
    MATTER, JC
    SMIRL, AL
    SCULLY, MO
    APPLIED PHYSICS LETTERS, 1976, 28 (09) : 507 - 509
  • [23] PASSIVATION OF MERCURY CADMIUM TELLURIDE SURFACES
    NEMIROVSKY, Y
    BAHIR, G
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1989, 7 (02): : 450 - 459
  • [24] SPUTTERED MERCURY CADMIUM TELLURIDE PHOTODIODE
    COHENSOLAI, G
    ZOZIME, A
    MOTTE, C
    RIANT, Y
    INFRARED PHYSICS, 1976, 16 (05): : 555 - 559
  • [25] CADMIUM MERCURY TELLURIDE INFRARED DETECTORS
    ELLIOTT, CT
    JOURNAL OF CRYSTAL GROWTH, 1985, 72 (1-2) : 453 - 461
  • [26] DIFFUSION IN MERCURY CADMIUM TELLURIDE - AN UPDATE
    SHAW, D
    JOURNAL OF ELECTRONIC MATERIALS, 1995, 24 (05) : 587 - 598
  • [27] CORROSION CHARACTERISTICS OF MERCURY CADMIUM TELLURIDE
    OHLSON, MJ
    TALASEK, RT
    SYLLAIOS, AJ
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1984, 131 (03) : C90 - C90
  • [28] RECOMBINATION IN CADMIUM MERCURY TELLURIDE PHOTODETECTORS
    BAKER, IM
    CAPOCCI, FA
    CHARLTON, DE
    WOTHERSPOON, JTM
    SOLID-STATE ELECTRONICS, 1978, 21 (11-1) : 1475 - 1480
  • [29] Cadmium telluride growth on patterned substrates for mercury cadmium telluride infrared detectors
    R. Bommena
    C. Fulk
    Jun Zhao
    T. S. Lee
    S. Sivananthan
    S. R. J. Brueck
    S. D. Hersee
    Journal of Electronic Materials, 2005, 34 : 704 - 709
  • [30] Cadmium telluride growth on patterned substrates for mercury cadmium telluride infrared detectors
    Bommena, R
    Fulk, C
    Zhao, J
    Lee, TS
    Sivananthan, S
    Brueck, SRJ
    Hersee, SD
    JOURNAL OF ELECTRONIC MATERIALS, 2005, 34 (06) : 704 - 709
12345