共 50 条
- [21] Assessment of the scatterometry capability to detect an etch process deviation [J]. MODELING ASPECTS IN OPTICAL METROLOGY IV, 2013, 8789
- [22] Process capability assessment for index Cpkbased on bayesian approach [J]. Metrika, 2005, 61 : 221 - 234
- [23] ASSESSMENT OF METALLURGICAL PROCESS CAPABILITY WITH MORE QUALITY CHARACTERISTICS [J]. METAL 2016: 25TH ANNIVERSARY INTERNATIONAL CONFERENCE ON METALLURGY AND MATERIALS, 2016, : 1646 - 1652
- [24] The Bayesian statistical model for process capability evaluation [J]. PROCEEDINGS OF THE 11TH INTERNATIONAL CONFERENCE ON INDUSTRIAL ENGINEERING AND ENGINEERING MANAGEMENT, VOLS 1 AND 2: INDUSTRIAL ENGINEERING AND ENGINEERING MANAGEMENT IN THE GLOBAL ECONOMY, 2005, : 284 - 288
- [27] Model of process capability of solder paste printing [J]. SMTA INTERNATIONAL PROCEEDINGS OF THE TECHNICAL PROGRAM, 1999, : 41 - 47
- [28] A tailored capability model for inspection process improvement [J]. SECOND ASIA-PACIFIC CONFERENCE ON QUALITY SOFTWARE, PROCEEDINGS, 2001, : 275 - 282
- [29] A multivariate process capability index model system [J]. Journal of Semiconductors, 2011, 32 (01) : 116 - 122
- [30] An Assessment Approach for Process Capability in Simple Linear Profile [J]. PROCEEDINGS OF THE 22ND INTERNATIONAL CONFERENCE ON INDUSTRIAL ENGINEERING AND ENGINEERING MANAGEMENT: CORE THEORY AND APPLICATIONS OF INDUSTRIAL ENGINEERING (VOL 1), 2016, : 613 - 620