TORTURE TESTS IMPROVE EQUIPMENT RELIABILITY

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作者：
RUTH, SB
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来源：
ELECTRONIC ENGINEER | 1969年 / 28卷 / 06期
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中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
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页码：80 / &
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