STUDY OF C-60-TDCN NANOMETER-SCALE THIN-FILMS

被引：0
|
作者：
XUE, ZQ
GAO, HJ
LIU, WM
WU, QD
CHEN, HY
QIANG, D
PANG, SJ
LIU, N
机构：
[1] BEIJING UNIV,DEPT CHEM,BEIJING 100871,PEOPLES R CHINA
[2] CHINESE ACAD SCI,BEIJING LAB VACUUM PHYS,BEIJING 100080,PEOPLES R CHINA
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 1994年 / 34卷
关键词：
ELECTRIC BISTABILITY; CONDUCTING POLYMER; ICB;
D O I：
暂无
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
A novel polymer, toluylene 2, 4-dicarbamidonitrile (TDCN) with carbon-nitrogen conjugated backbones, has been synthesised in our Polymer Laboratory. The C-60-TDCN thin films have been prepared by the ICB-TOFMS deposition system. The C-60-TDCN thin films are very good crystalline and possess electric bistability.
引用
收藏
页码：197 / 199
页数：3
相关论文
共 50 条
  • [11] Three-Dimensional Fine Structure of Nanometer-Scale Nafion Thin Films
    Peltonen, A.
    Etula, J.
    Seitsonen, J.
    Engelhardt, P.
    Laurila, T.
    ACS APPLIED POLYMER MATERIALS, 2021, 3 (02) : 1078 - 1086
  • [12] Atomistic simulations of the nanometer-scale indentation of amorphous-carbon thin films
    Sinnott, SB
    Colton, RJ
    White, CT
    Shenderova, OA
    Brenner, DW
    Harrison, JA
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1997, 15 (03): : 936 - 940
  • [13] Photocatalytic Decomposition of Organic Thin Films in a Nanometer-Scale by an Atomic Force Microscope
    Kobayashi, Kenkichiro
    Tomita, Yasumasa
    Maeda, Yasuhisa
    JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 2009, 9 (06) : 3382 - 3386
  • [14] Fatigue properties of nanometer-scale copper films
    Zhang, B.
    Sun, K. H.
    Gong, J.
    Sun, C.
    Wang, Z. G.
    Zhang, G. P.
    PROGRESSES IN FRACTURE AND STRENGTH OF MATERIALS AND STRUCTURES, 1-4, 2007, 353-358 : 116 - +
  • [15] NANOMETER-SCALE MECHANICS OF GOLD-FILMS
    TANGYUNYONG, P
    THOMAS, RC
    HOUSTON, JE
    MICHALSKE, TA
    CROOKS, RM
    HOWARD, AJ
    PHYSICAL REVIEW LETTERS, 1993, 71 (20) : 3319 - 3322
  • [16] DEMBER EFFECT IN C(60) THIN-FILMS
    SARKAR, D
    HALAS, NJ
    SOLID STATE COMMUNICATIONS, 1994, 90 (04) : 261 - 265
  • [17] FRICTIONAL AND ATOMIC-SCALE STUDY OF C-60 THIN-FILMS BY SCANNING FORCE MICROSCOPY
    LUTHI, R
    HAEFKE, H
    MEYER, E
    HOWALD, L
    LANG, HP
    GERTH, G
    GUNTHERODT, HJ
    ZEITSCHRIFT FUR PHYSIK B-CONDENSED MATTER, 1994, 95 (01): : 1 - 3
  • [18] OXIDE THIN-FILMS FOR NANOMETER SCALE ELECTRON-BEAM LITHOGRAPHY
    HOLLENBECK, JL
    BUCHANAN, RC
    JOURNAL OF MATERIALS RESEARCH, 1990, 5 (05) : 1058 - 1072
  • [19] NANOMETER SCALE MECHANICAL-PROPERTIES OF AU(111) THIN-FILMS
    SALMERON, M
    FOLCH, A
    NEUBAUER, G
    TOMITORI, M
    OGLETREE, DF
    KOLBE, W
    LANGMUIR, 1992, 8 (11) : 2832 - 2842
  • [20] Flow-induced composition modulated NiFe thin films with nanometer-scale wavelengths
    Leith, SD
    Schwartz, DT
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1996, 143 (03) : 873 - 878
12345