ELECTRICAL CONNECTORS

被引：0
|
作者：
DUMMER, GWA
机构：
来源：
RADIO AND ELECTRONIC ENGINEER | 1973年 / 43卷 / 09期
关键词：
D O I：
10.1049/ree.1973.0082
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：545 / 546
页数：2
相关论文
共 50 条
  • [31] Automated Design of Gripper Systems for Electrical Connectors
    Gebauer, Daniel
    Dirr, Jonas
    Daub, Rüdiger
    Procedia CIRP, 2023, 118 : 924 - 929
  • [32] NEW RESINS BROADEN CHOICES IN ELECTRICAL CONNECTORS
    WOOD, AS
    MODERN PLASTICS, 1980, 57 (07): : 46 - 47
  • [33] A model to describe intermittency phenomena in electrical connectors
    Maul, C
    McBride, JW
    ELECTRICAL CONTACTS-2002: PROCEEDINGS OF THE FORTY-EIGHTH IEEE HOLM CONFERENCE ON ELECTRICAL CONTACTS, 2002, : 165 - 174
  • [34] RELIABILITY OF CLAD METAL INLAYS FOR ELECTRICAL CONNECTORS
    LEE, FFM
    IEEE TRANSACTIONS ON PARTS HYBRIDS AND PACKAGING, 1977, 13 (01): : 61 - 67
  • [35] MEASUREMENT OF RF LEAKAGE IN MULTIPIN ELECTRICAL CONNECTORS
    SCHOR, FW
    IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, 1968, EM10 (01) : 135 - &
  • [36] Vibration thresholds for fretting corrosion in electrical connectors
    Flowers, GT
    Xie, F
    Bozack, MJ
    Malucci, RD
    IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES, 2004, 27 (01): : 65 - 71
  • [37] DEVELOPMENT OF A RADIOGRAPHIC TECHNIQUE FOR MATED ELECTRICAL CONNECTORS
    BROWNE, RW
    ROBERTSO.WB
    MATERIALS EVALUATION, 1967, 25 (10) : 221 - &
  • [38] Vibration thresholds for fretting corrosion in electrical connectors
    Flowers, GT
    Xie, F
    Bozack, M
    Malucci, RD
    ELECTRICAL CONTACTS-2002: PROCEEDINGS OF THE FORTY-EIGHTH IEEE HOLM CONFERENCE ON ELECTRICAL CONTACTS, 2002, : 133 - 139
  • [39] Numerical Simulation of Random Vibration for Electrical Connectors
    Huang, Bo
    Li, Xunbo
    Zeng, Zhi
    Li, Xiang
    Fang, Wenhua
    FRONTIERS OF MANUFACTURING SCIENCE AND MEASURING TECHNOLOGY III, PTS 1-3, 2013, 401 : 416 - 421
  • [40] RELIABILITY OF ELECTRICAL CONNECTORS USED IN ELECTRONIC EQUIPMENT
    MAZARD, P
    WEARDEN, TB
    MICROELECTRONICS RELIABILITY, 1970, 9 (02) : 99 - &
12345