HIGH-FREQUENCY FATIGUE TESTING OF FERROELECTRIC MEMORY CAPACITORS

被引:1
|
作者
KISLER, Y
SMITH, IW
机构
[1] Raytheon Research Division, Lexington, MA 02173
来源
REVIEW OF SCIENTIFIC INSTRUMENTS | 1992年 / 63卷 / 05期
关键词
D O I
10.1063/1.1142579
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Fatigue testing of typical process-development ferroelectric capacitors requires application of controlled high-frequency waveforms to a capacitor (in the nF range) whose impedance at frequencies of interest is only a few OMEGA. Only experimental setups which have been designed with this fact in mind will give meaningful results. We analyze a range of typical setups and give the maximum fatigue frequency for each. A simple, standard setup may only allow frequencies of 20 kHz (10(9) cycles in an overnight run). A well-optimized setup will work at frequencies in the MHz range, allowing reaching 10(11) cycles in an overnight run.
引用
收藏
页码:3205 / 3208
页数:4
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