Multilayer X-ray mirrors Mo-B4C - new crystals-analyzers for wavelength range of 5 to 12 angstrom

被引：0
|
作者：
Kopylets, I. A. [1 ]
Baturin, A. A. [1 ]
Mikhailov, I. F. [1 ]
机构：
[1] Natl Tech Univ, Kharkiv Polytech Inst, 21 Frunze St, UA-61002 Kharkov, Ukraine
来源：
FUNCTIONAL MATERIALS | 2007年 / 14卷 / 03期
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中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Structure and X-ray optical properties of Mo-B4C multilayer mirrors with period from 13.2 to 33.8 angstrom have been studied. The reflectivity values for the Mo-B4C mirrors and the traditionally applied RbAP crystal (2d = 26.5 angstrom) have been measured in the 4.7 to 11.9 angstrom range. The interlayer boundary roughness attaining 3 angstrom was found to be the main structure cause of the reflectivity drop with decreasing mirror period. The Mo-B4C multilayer X-ray mirrors have been shown to provide 2 to 5 times intensity gain as compared to RbAP ones and to be the promising broadband diffraction elements.
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页码：392 / 394
页数：3
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