DETERMINATION OF THE THICKNESS OF THE SENSITIVE LAYER OF SEMICONDUCTOR-DETECTORS WITH THE AID OF BETA-SOURCES AND GAMMA-SOURCES

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作者：
ALEKSANDROV, AA
KIRSANOVA, IV
LYAPIDEVSKII, VK
FEDOSEEVA, OP
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INSTRUMENTS AND EXPERIMENTAL TECHNIQUES | 1978年 / 21卷 / 05期
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T [工业技术];
学科分类号：
08 ;
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页码：1201 / 1203
页数：3
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