PHOTO-IONIZATION CROSS-SECTION OF POSITIVELY CHARGED DIVACANCIES IN SILICON DEDUCED FROM PHOTOCAPACITANCE MEASUREMENTS

被引：0

作者：

KOLESNIKOV, NV

LEBEDEV, AA

MALKHANOV, SE

机构：

来源：

SOVIET PHYSICS SEMICONDUCTORS-USSR | 1979年 / 13卷 / 04期

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中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

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引用

页码：479 / 479

页数：1

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