X-RAY DIFFRACTION STUDY OF LEAD SULFIDE-ARSENIC SULFIDE GLASSES

被引：26
|
作者：
PETZ, JI
AMSTUTZ, GC
KRUH, RF
机构：
来源：
JOURNAL OF CHEMICAL PHYSICS | 1961年 / 34卷 / 02期
关键词：
D O I：
10.1063/1.1700978
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：526 / &
相关论文
共 50 条
  • [1] X-RAY-DIFFRACTION STUDY OF STRUCTURE OF ANNEALED AND ILLUMINATED ARSENIC-SULFIDE GLASSES
    DOTSENKO, VI
    YURYEV, GS
    [J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1978, 34 : S199 - S199
  • [2] X-RAY DIFFRACTION STUDY OF LEAD SILICATE GLASSES
    MYDLAR, MF
    KREIDL, NJ
    HENDREN, JK
    CLAYTON, GT
    [J]. PHYSICS AND CHEMISTRY OF GLASSES, 1970, 11 (06): : 196 - &
  • [3] Wide angle x-ray diffraction studies of nanocrystalline lead europium sulfide
    Kelly, John G.
    He, Weidong
    Somarajan, Suseela
    Yager, Kevin G.
    Dickerson, James H.
    [J]. MATERIALS LETTERS, 2012, 89 : 198 - 201
  • [4] X-RAY DIFFRACTION STUDY OF ARSENIC TRISULFIDE-IODINE GLASSES
    HOPKINS, TE
    GOULD, ES
    HERNDON, JR
    PASTERNAK, RA
    [J]. JOURNAL OF PHYSICAL CHEMISTRY, 1962, 66 (04): : 733 - &
  • [5] USE OF X-RAY-DIFFRACTION IN PREPARATION AND STUDY OF TERNARY SULFIDE OF LEAD AND INDIUM
    ARRIORTUA, MI
    IGLESIAS, JE
    AMIGO, JM
    [J]. ANALES DE QUIMICA, 1979, 75 (11): : 787 - 791
  • [6] A study of cadmium sulfide nanocrystalline films by grazing incidence X-ray diffraction
    Kozhevnikova, N. S.
    Rempel, A. A.
    Hergert, F.
    Magerl, A.
    [J]. RUSSIAN JOURNAL OF PHYSICAL CHEMISTRY A, 2007, 81 (05) : 768 - 772
  • [7] A study of cadmium sulfide nanocrystalline films by grazing incidence X-ray diffraction
    N. S. Kozhevnikova
    A. A. Rempel
    F. Hergert
    A. Magerl
    [J]. Russian Journal of Physical Chemistry A, 2007, 81 : 768 - 772
  • [8] Homogeneous sulfide precipitation catalysts characterized by X-ray diffraction
    [J]. Cruz-Reyes, J., 1600, (08): : 11 - 12
  • [9] Network vs Molecular Structural Characteristics of Ge-Doped Arsenic Sulfide Glasses: A Combined Neutron/X-ray Diffraction, Extended X-ray Absorption Fine Structure, and Raman Spectroscopic Study
    Soyer-Uzun, S.
    Sen, S.
    Aitken, B. G.
    [J]. JOURNAL OF PHYSICAL CHEMISTRY C, 2009, 113 (15): : 6231 - 6242
  • [10] X-RAY DETERMINATION OF THERMAL-EXPANSION OF LEAD SULFIDE
    SIRDESHMUKH, DB
    DESHPANDE, VT
    [J]. INDIAN JOURNAL OF PURE & APPLIED PHYSICS, 1973, 11 (05) : 366 - 366
12345