Wide angle x-ray diffraction studies of nanocrystalline lead europium sulfide

被引：2
|
作者：
Kelly, John G. [2 ]
He, Weidong [3 ]
Somarajan, Suseela [1 ,4 ]
Yager, Kevin G. [5 ]
Dickerson, James H. [1 ,4 ,6 ]
机构：
[1] Vanderbilt Univ, Dept Phys & Astron, Nashville, TN 37235 USA
[2] Tennessee State Univ, Dept Math & Phys, Nashville, TN 37203 USA
[3] Vanderbilt Univ, Interdisciplinary Grad Program Mat Sci, Nashville, TN USA
[4] Vanderbilt Univ, Vanderbilt Inst Nanoscale Sci & Engn, Nashville, TN USA
[5] Brookhaven Natl Lab, Ctr Funct Nanomat, Upton, NY 11973 USA
[6] Vanderbilt Univ, Dept Chem, Nashville, TN 37235 USA
来源：
MATERIALS LETTERS | 2012年 / 89卷
基金：
美国国家科学基金会;
关键词：
Rare earth; Dilute magnetic semiconductor; Nanoparticle; Thermolysis; FILMS;
D O I：
10.1016/j.matlet.2012.08.093
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
In this letter, we report the characterization of lead sulfide (PbS), europium sulfide (EuS), and lead europium sulfide (Pbt-xEuxS) nanocrystals using wide-angle x-ray scattering analysis. The results confirmed the high purity and crystallinity of the nanomaterials. In complement to previous studies on this family of ternary materials, the Pb1-xEuxS nanocrystals were well alloyed, with no evidence of phase separation, which bodes well for their implementation in optical and magnetic device applications. (C) 2012 Elsevier B.V. All rights reserved.
引用
收藏
页码：198 / 201
页数：4
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