THE ANALYSIS OF THIN-FILMS, INTERFACES AND SURFACES - PREFACE

被引：0

作者：

GARTEN, RPH ^{[1
]}

WERNER, HW ^{[1
]}

机构：

[1] VIENNA TECH UNIV,INST ALLGEMEINE PHYS,A-1040 VIENNA,AUSTRIA

来源：

ANALYTICA CHIMICA ACTA | 1994年 / 297卷 / 1-2期

关键词：

D O I：

暂无

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：1 / 1

页数：1

共 50 条

[21] ANALYSIS OF SURFACES AND THIN-FILMS BY IR, RAMAN, AND OPTICAL SPECTROSCOPY
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ACS SYMPOSIUM SERIES, 1982, 199 : 33 - 47
[22] UHV SYSTEM FOR INSITU PREPARATION AND ANALYSIS OF THIN-FILMS AND SURFACES
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[23] ANALYSIS OF SURFACES AND THIN-FILMS BY INFRARED, RAMAN AND OPTICAL SPECTROSCOPY
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[24] INFRARED INTERFEROMETRIC ANALYSIS OF THIN-FILMS AND OPTICAL-SURFACES
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[25] BACKSCATTERING ANALYSIS OF THIN-FILMS ON NON-FLAT SURFACES
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[26] NOVEL OPTICAL TECHNIQUES FOR THE ANALYSIS OF POLYMER SURFACES AND THIN-FILMS
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[27] CHARACTERIZATION OF OPTICAL THIN-FILMS AND SURFACES
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JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1979, 69 (10) : 1426 - 1426
[28] REFLECTIONS ON SURFACES, COATINGS, AND THIN-FILMS
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[29] RUTHERFORD BACKSCATTERING ANALYSIS OF GLASS SURFACES AND TIOX THIN-FILMS
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THIN SOLID FILMS, 1981, 85 (3-4) : 343 - 347
[30] FERROMAGNETISM NEAR SURFACES AND IN THIN-FILMS
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