ON THE NATURE OF THE DEFECT REVERSE ANNEALING IN ION-IMPLANTED SILICON

被引:3
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DVURECHENSKY, AV
RYAZANTSEV, IA
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10.1080/00337578008209161
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TL [原子能技术]; O571 [原子核物理学];
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0827 ; 082701 ;
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页码:129 / 132
页数:4
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