MICROWAVE PROPERTIES OF FREESTANDING DIELECTRIC FILMS

被引：15

作者：

ROBERTSON, WM ^{[1
]}

ARJAVALINGAM, G ^{[1
]}

HOUGHAM, G ^{[1
]}

KOPCSAY, GV ^{[1
]}

EDELSTEIN, D ^{[1
]}

REE, MH ^{[1
]}

CHAPPLESOKOL, JD ^{[1
]}

机构：

[1] IBM CORP,CTR SEMICOND RES & DEV,HOPEWELL JUNCTION,NY 12533

来源：

ELECTRONICS LETTERS | 1992年 / 28卷 / 01期

关键词：

DIELECTRICS AND DIELECTRIC DEVICES; MICROWAVE MEASUREMENT; SPECTROSCOPY;

D O I：

10.1049/el:19920039

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Measurement of the broadband (15-150 GHz) microwave dielectric properties of free-standing films is demonstrated using the technique of coherent microwave transient spectroscopy. The accuracy of the method is verified by experiments on a fused silica sheet whose dielectric properties are well known. Results of measurements on (approximately 200-mu-m thick) polymer films are presented.

引用

页码：62 / 63

页数：2

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