A MODIFIED TARGET CURRENT DISPLAY SYSTEM FOR ELECTRON PROBE MICROANALYZER

被引：0
|
作者：
SANECKI, JE
OBOYLE, DR
机构：
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1970年 / 41卷 / 11期
关键词：
D O I：
10.1063/1.1684359
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：1621 / &
相关论文
共 50 条
  • [21] USE OF ELECTRON PROBE MICROANALYZER ON RETURNED LUNAR SAMPLES
    ALBEE, AL
    CHODOS, AA
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1971, (MAR-A): : 7 - &
  • [22] PLANAR SILICON DEVICE ANALYSES WITH THE ELECTRON PROBE MICROANALYZER
    NEALEY, CC
    LAAKSO, CW
    HAGON, PJ
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1964, 111 (08) : C205 - C205
  • [23] OPTICAL SPECTROMETER FOR ELECTRON-PROBE MICROANALYZER.
    Zamoryanskaya, M.V.
    Zamoryanskii, A.N.
    Vainshenker, I.A.
    Instruments and experimental techniques New York, 1987, 30 (4 pt 2): : 932 - 935
  • [24] THE ELECTRON-PROBE MICROANALYZER AS A TOOL IN GEOLOGICAL RESEARCH
    ALAPIETI, T
    SIVONEN, SJ
    ULTRAMICROSCOPY, 1982, 9 (04) : 398 - 399
  • [25] A NEW ELECTRON PROBE X-RAY MICROANALYZER
    MERRILL, HB
    IEEE SPECTRUM, 1965, 2 (03) : 58 - &
  • [26] Quantitative WDS analysis using electron probe microanalyzer
    Ul-Hamid, A
    Tawancy, HM
    Mohammed, ARI
    Al-Jaroudi, SS
    Abbas, NM
    MATERIALS CHARACTERIZATION, 2006, 56 (03) : 192 - 199
  • [27] ANALYSIS FO TRACE CONSTITUENTS WITH ELECTRON PROBE MICROANALYZER
    HEINRICH, KF
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1971, (MAR-A): : 24 - &
  • [28] REMOVABLE MYLAR WINDOW FOR ELECTRON-PROBE MICROANALYZER
    REICHARD, TE
    COAKLEY, WS
    ANALYTICAL CHEMISTRY, 1965, 37 (06) : 773 - &
  • [29] OXIDE THICKNESS MEASUREMENT IN THE ELECTRON-PROBE MICROANALYZER
    BLACHERE, JR
    KLIMOVICH, DF
    JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1987, 70 (11) : C324 - C326
  • [30] SOME EXAMPLES OF WORK WITH THE ELECTRON-PROBE MICROANALYZER
    HORNBLOWER, AP
    ARCHAEOMETRY, 1963, 6 (01) : 37 - 42
12345