DIFFRACTOGRAMS OF ELECTRON-MICROGRAPHS TAKEN WITH ASTIGMATIC OBJECT ILLUMINATION AND THE POSSIBILITIES OF THEIR APPLICATION FOR BRIGHTNESS MEASUREMENTS IN ASTIGMATIC BEAMS

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作者：

HANSSEN, KJ

ADE, G

LAUER, R

机构：

来源：

OPTIK | 1986年 / 73卷 / 04期

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中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

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页码：163 / 173

页数：11

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