HIGH-VOLTAGE ELECTRON TRANSMISSION MICROSCOPY OF PYROLYTIC SILICON-CARBIDE COATINGS FROM NUCLEAR FUEL PARTICLES

被引：22
|
作者：
HUDSON, B [1 ]
SHELDON, BE [1 ]
机构：
[1] ATOM ENERGY RES ESTAB,MET DIV,HARWELL,BERKSHIRE,ENGLAND
来源：
JOURNAL OF MICROSCOPY-OXFORD | 1973年 / 97卷 / JAN-M期
关键词：
D O I：
10.1111/j.1365-2818.1973.tb03765.x
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
收藏
页码：113 / 119
页数：7
相关论文
共 50 条
  • [41] OBSERVATION OF AN ADIABATIC SHEAR BAND IN TITANIUM BY HIGH-VOLTAGE TRANSMISSION ELECTRON-MICROSCOPY
    MEYERS, MA
    PAK, HR
    ACTA METALLURGICA, 1986, 34 (12): : 2493 - 2499
  • [42] COLLOIDAL GOLD LABELING OBSERVED BY BACKSCATTERED ELECTRON-MICROSCOPY COMBINED WITH HIGH-VOLTAGE TRANSMISSION ELECTRON-MICROSCOPY
    TAKATA, K
    AKIMOTO, Y
    KAWAKAMI, H
    OGURA, K
    YAMAGISHI, S
    HIRANO, H
    JOURNAL OF ELECTRON MICROSCOPY, 1988, 37 (05): : 233 - 233
  • [43] Transmission electron microscopy studies of oxidation of single crystal silicon carbide at high temperature
    Chayasombat, B.
    Tarumi, N.
    Kato, T.
    Hirayama, T.
    Sasaki, K.
    Kuroda, K.
    PRICM 6: SIXTH PACIFIC RIM INTERNATIONAL CONFERENCE ON ADVANCED MATERIALS AND PROCESSING, PTS 1-3, 2007, 561-565 : 2135 - +
  • [44] STRENGTH OF SILICON-CARBIDE LAYERS OF FUEL-PARTICLES FOR HIGH-TEMPERATURE GAS-COOLED REACTORS
    LESSING, PA
    HEAPS, RJ
    NUCLEAR TECHNOLOGY, 1994, 108 (02) : 207 - 234
  • [45] High-Voltage Capacitive Nonlinear Transmission Lines for RF Generation Based on Silicon Carbide Schottky Diodes
    Raimundi, Lucas R.
    Rossi, Jose O.
    Lopes Rangel, Elizete G.
    Silva, Leandro C.
    Schamiloglu, Edl
    IEEE TRANSACTIONS ON PLASMA SCIENCE, 2019, 47 (01) : 566 - 573
  • [46] Computer-assisted simulation of high-voltage electron microscopy using serial images recorded by conventional transmission electron microscopy
    Pascher, R
    Berthold, CH
    Rydmark, M
    JOURNAL OF ELECTRON MICROSCOPY, 2002, 51 (02): : 113 - 126
  • [47] Observation of an adiabatic shear band in AlSl 4340 steel by high-voltage transmission electron microscopy
    Wittman, C.L., 1600, (21 A):
  • [48] APPLICATIONS OF MANY BEAM SYSTEMATIC DIFFRACTION CONTRAST IN HIGH-VOLTAGE TRANSMISSION ELECTRON-MICROSCOPY
    CHEN, LJ
    THOMAS, G
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1974, 25 (01): : 193 - 204
  • [49] INVESTIGATION OF CRYSTALLOSIS OF THE KIDNEY BY MEANS OF POLARIZATION, SCANNING, TRANSMISSION AND HIGH-VOLTAGE ELECTRON-MICROSCOPY
    SIEW, S
    ISRAEL JOURNAL OF MEDICAL SCIENCES, 1979, 15 (08): : 698 - 710
  • [50] Electron beam induced current investigation of high-voltage 4H silicon carbide diodes
    Österman, John
    Hallén, Anders
    Jargelius, Mikael
    Zimmermann, Uwe
    Galeckas, Augustinas
    Breitholtz, Bo
    Materials Science Forum, 2000, 338
12345