LOW-ENERGY ELECTRON LOSS SPECTROSCOPY OF SI-GE INTERFACES

被引：16
|
作者：
PERFETTI, P
NANNARONE, S
PATELLA, F
QUARESIMA, C
CERRINA, F
CAPOZI, M
SAVOIA, A
LINDAU, I
机构：
来源：
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 1981年 / 19卷 / 03期
关键词：
D O I：
10.1116/1.571056
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
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页码：319 / 322
页数：4
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