ON A SYSTEMATIC ERROR IN THE MEASUREMENT OF OPTICAL CONSTANTS

被引：12
|
作者：
CONN, GKT
EATON, GK
机构：
来源：
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA | 1954年 / 44卷 / 06期
关键词：
D O I：
10.1364/JOSA.44.000477
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：477 / 483
页数：7
相关论文
共 50 条
  • [21] Warpage measurement system with systematic error analysis
    Qiu, Y
    Ding, H
    Ume, IC
    Kang, YL
    OPTICAL TECHNOLOGY AND IMAGE PROCESSING FOR FLUIDS AND SOLIDS DIAGNOSTICS 2002, 2002, 5058 : 627 - 632
  • [22] SYSTEMATIC-ERROR IN THE MEASUREMENT OF COMPLEX QUANTITIES
    FROLOV, GV
    MEASUREMENT TECHNIQUES, 1981, 24 (01) : 37 - 40
  • [23] ERROR CONSTANTS AND ERROR SERIES
    GUPTA, SC
    PROCH, G
    IEEE TRANSACTIONS ON AUTOMATIC CONTROL, 1967, AC12 (05) : 617 - &
  • [24] SYSTEMATIC-ERROR OF COLLIMATION OPTICAL COUPLING
    GUZENKO, GA
    SOVIET JOURNAL OF OPTICAL TECHNOLOGY, 1982, 49 (05): : 268 - 272
  • [25] Optical constants measurement system for α:H silicon film
    Jiang Quan
    Lin Zu-lun
    Cheng Jian-bo
    Qi Kang-cheng
    Ge Chang-jun
    3RD INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGIES: OPTICAL TEST AND MEASUREMENT TECHNOLOGY AND EQUIPMENT, PARTS 1-3, 2007, 6723 : W7235 - W7235
  • [26] ERROR PROBABILITY MEASUREMENT IN A BINARY OPTICAL CHANNEL
    VARTANYAN, ES
    VARTANYA.EG
    KAZARYAN, RA
    GASPARYAN, SS
    MANUCHARYAN, RG
    RADIO ENGINEERING AND ELECTRONIC PHYSICS-USSR, 1971, 16 (08): : 1394 - +
  • [27] MEASUREMENT OF ERROR PROBABILITY IN ATMOSPHERIC OPTICAL JUNCTION
    DAINO, B
    GALEOTTI, M
    SETTE, D
    ELETTROTECNICA, 1974, 61 (07): : 680 - 680
  • [28] MEASUREMENT OF THE MAGNETO-OPTICAL CONSTANTS OF REACTIVE METALS
    CONNELL, GAN
    APPLIED OPTICS, 1983, 22 (20): : 3155 - 3159
  • [29] Measurement of optical constants of Hg1-xCdxTe
    Li, Quanbao
    Song, Bingwen
    Wei, Tianqu
    Hongwai jishu, 1991, 13 (05): : 17 - 20
  • [30] ERROR ANALYSIS OF OPTICAL RANGE MEASUREMENT SYSTEMS
    SALWEN, HC
    PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1970, 58 (10): : 1741 - &
12345