APPLICATION OF SECONDARY ION MASS-SPECTROMETRY TO ADHESION STUDIES

被引:4
|
作者
BRIGGS, D
机构
来源
JOURNAL OF ADHESION | 1987年 / 21卷 / 3-4期
关键词
D O I
10.1080/00218468708074980
中图分类号
TQ [化学工业];
学科分类号
0817 ;
摘要
引用
收藏
页码:343 / 352
页数:10
相关论文
共 50 条
  • [21] SECONDARY ION MASS-SPECTROMETRY OF SEMICONDUCTORS
    WILSON, RG
    PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 1984, 463 : 86 - 87
  • [22] SECONDARY ION MASS-SPECTROMETRY (SIMS)
    STUCK, R
    SIFFERT, P
    PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS, 1984, 8 (1-2): : 11 - 57
  • [23] SECONDARY-ION MASS-SPECTROMETRY
    GRASSERBAUER, M
    CHEMIE IN UNSERER ZEIT, 1994, 28 (05) : 222 - 232
  • [24] SECONDARY ION MASS-SPECTROMETRY OF POLYMERS
    CAMPANA, JE
    ROSE, SL
    INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1983, 46 (JAN): : 483 - 486
  • [25] SECONDARY-ION MASS-SPECTROMETRY
    ZALM, PC
    VACUUM, 1994, 45 (6-7) : 753 - 772
  • [26] MOLECULAR SECONDARY ION MASS-SPECTROMETRY
    PACHUTA, SJ
    COOKS, RG
    ACS SYMPOSIUM SERIES, 1985, 291 : 1 - 42
  • [27] SECONDARY ION MASS-SPECTROMETRY FOR SULFOGLYCOLIPIDS - APPLICATION OF NEGATIVE-ION DETECTION
    KUSHI, Y
    HANDA, S
    ISHIZUKA, I
    JOURNAL OF BIOCHEMISTRY, 1985, 97 (02): : 419 - 428
  • [28] APPLICATION OF SECONDARY-ION MASS-SPECTROMETRY TO THE ANALYSIS OF ENVIRONMENTAL OBJECTS
    BARBASHEV, SV
    PRISTER, BS
    VLASYUK, VI
    JOURNAL OF ANALYTICAL CHEMISTRY OF THE USSR, 1988, 43 (02): : 229 - 233
  • [29] APPLICATION OF SECONDARY ION MASS-SPECTROMETRY (SIMS) FOR THE ANALYSIS OF ASBESTOS FIBERS
    SEYAMA, H
    SOMA, Y
    SOMA, M
    TAKAO, S
    SAKURAI, T
    TAGAMI, S
    FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY, 1991, 341 (10): : 619 - 624
  • [30] A NOVEL ION IMAGER FOR SECONDARY ION MASS-SPECTROMETRY
    MATSUMOTO, K
    YURIMOTO, H
    KOSAKA, K
    MIYATA, K
    NAKAMURA, T
    SUENO, S
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1993, 40 (01) : 82 - 85