IN-SITU PHOTOTHERMAL SPECTROSCOPY METHOD FOR INVESTIGATING SURFACE CHANGES DURING ELECTROPLATING OF NICKEL

被引:1
|
作者
JIANG, ZY [1 ]
XIANG, Y [1 ]
QIAN, B [1 ]
JIN, CG [1 ]
SHI, BW [1 ]
SHAN, SP [1 ]
机构
[1] ACAD SINICA,SHANGHAI INST ORGAN CHEM,SHANGHAI 200032,PEOPLES R CHINA
来源
JOURNAL OF ELECTROANALYTICAL CHEMISTRY | 1993年 / 361卷 / 1-2期
基金
中国国家自然科学基金;
关键词
D O I
10.1016/0022-0728(93)87062-Z
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
A PTS method was used to monitor in situ the variations in surface structure during the early stages of nickel plating on a copper electrode. It was found that the changes in the photothermal signal indicated the existence of an intermediate state with a relatively rough surface before a smooth plating layer is formed. On the basis of these results combined with SEM data, the following process for the initial stages of nickel plating was suggested. First, a smooth copper surface is transformed into a relatively rough surface; with continuous plating, this changes into a well-distributed surface. The minimum thickness for a nickel plating layer with a uniform stable surface structure is about 536 monolayers at a current density of 8 mA/cm2. © 1993.
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页码:257 / 260
页数:4
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