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- [7] Surface Ramam Spectroscopy for in Situ Investigating Silicon Etching Process 2000, Science Press (20):
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- [10] Surface dynamics during MBE growth of GaAs(001) monitored by in-situ reflectance difference spectroscopy PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 0, NO 8, 2003, 0 (08): : 3012 - 3016