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ULTRAFAST BEAM-DEFLECTION METHOD AND ITS APPLICATION FOR MEASURING THE TRANSIENT REFRACTIVE-INDEX OF MATERIALS

被引：23
|
作者：
ALBRECHT, HS
HEIST, P
KLEINSCHMIDT, J
LAP, DV
机构：
[1] FRIEDRICH SCHILLER UNIV JENA,MAX PLANCK ARBEITSGRP RONTGENOPT,D-07743 JENA,GERMANY
[2] LAMBDA PHYS GMBH,D-37079 GOTTINGEN,GERMANY
来源：
APPLIED PHYSICS B-PHOTOPHYSICS AND LASER CHEMISTRY | 1993年 / 57卷 / 03期
关键词：
D O I：
10.1007/BF00334534
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
We represent an ultrafast beam-deflection method as a simple and powerful tool for the time-resolved measurement of induced changes of the refractive index in the order of DELTAn = 10(-5). The method is applied for measuring the changes of components of the refractive index parallel and perpendicular to the pump-pulse polarization on a femtosecond time scale. Fused silica and CS2 are used as samples for demonstrating our method.
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页码：193 / 197
页数：5
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