SURFACE RECONSTRUCTION OF UV-LASER IRRADIATED POLY(ETHYLENE-TEREPHTHALATE) BY ATOMIC FORCE MICROSCOPY

被引：7
|
作者：
WEFERS, L [1 ]
KNITTEL, D [1 ]
BOSBACH, D [1 ]
RAMMENSEE, W [1 ]
SCHOLLMEYER, E [1 ]
机构：
[1] UNIV COLOGNE,INST MINERAL PETROG,W-5000 COLOGNE 1,GERMANY
来源：
APPLIED SURFACE SCIENCE | 1992年 / 59卷 / 3-4期
关键词：
D O I：
10.1016/0169-4332(92)90127-J
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
Atomic force microscopy (AFM) is utilized for the evaluation of change in the surface topography of highly absorbing poly(ethylene terephthalate) (PET) films after UV-laser treatment with 248 nm. Three-dimensional data of the surface microstructure were taken from samples. Particularly low fluence treatment with a few laser pulses was studied. A change in surface topography was found in relation to the number of pulses applied.
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页码：267 / 271
页数：5
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