NEW STRAIN-ANALYSIS TECHNIQUE BASED ON THIN-FILM OPTICAL MEASUREMENTS

被引:0
|
作者
WILLIAMS, JG
机构
关键词
D O I
暂无
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:N30 / &
相关论文
共 50 条
  • [41] A NEW TECHNIQUE FOR CHARACTERIZATION OF THIN-FILM FERROELECTRIC MEMORY DEVICES
    ROHRER, G
    NARAYAN, S
    MCMILLAN, L
    KULKARNI, A
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (03): : 1756 - 1758
  • [42] A THIN-FILM DIODE STRAIN SENSOR
    MOORE, RM
    BUSANOVI.CJ
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1969, ED16 (02) : 253 - &
  • [43] Patchable thin-film strain gauges based on pentacene transistors
    Kim, Ju-Hyung
    Liang, Yuchen
    Seo, Soonmin
    ORGANIC ELECTRONICS, 2015, 26 : 355 - 358
  • [44] Analysis of Thin-film Inhomogeneities Using Electroluminescence and LBIC Measurements
    Zaunbrecher, Katherine
    Johnston, Steve
    Sites, James R.
    2013 IEEE 39TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC), 2013, : 166 - 169
  • [45] Measurements of thin-film elastic constants
    Hirao, Masahiko
    Ogi, Hirotsugu
    Nihon Kikai Gakkai Ronbunshu, A Hen/Transactions of the Japan Society of Mechanical Engineers, Part A, 2009, 75 (752): : 397 - 403
  • [46] MEASUREMENTS OF THE WEAR OF A THIN-FILM DISK
    PHIPPS, PBP
    IEEE TRANSACTIONS ON MAGNETICS, 1990, 26 (05) : 2496 - 2498
  • [47] Measurements of Thin-Film Lasers.
    Zeidler, Guenter
    1600, (26):
  • [48] PICKING A SPECTROPHOTOMETER FOR THIN-FILM MEASUREMENTS
    ARMITAGE, P
    PHOTONICS SPECTRA, 1986, 20 (04) : 63 - &
  • [49] A NEW MATERIAL FOR OPTICAL, ELECTRICAL AND ELECTRONIC THIN-FILM MEMORIES
    HUA, ZY
    CHEN, GR
    VACUUM, 1992, 43 (11) : 1019 - 1023
  • [50] RESISTANCE MEASUREMENTS ON THIN-FILM SUBSTRATES AS A TECHNIQUE FOR STUDYING THE DETERIORATION OF COATED METALS
    MCINTYRE, JF
    LEIDHEISER, H
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1984, 188 (AUG): : 75 - INDE