A FLEXIBLE NEURAL ANALOG USING INTEGRATED CIRCUITS

被引:63
|
作者
FRENCH, AS
STEIN, RB
机构
关键词
D O I
10.1109/TBME.1970.4502739
中图分类号
R318 [生物医学工程];
学科分类号
0831 ;
摘要
引用
收藏
页码:248 / &
相关论文
共 50 条
  • [21] MACROMODELS OF ANALOG INTEGRATED-CIRCUITS
    FESECHKO, VA
    IVANUSHKINA, NG
    KOZACHUK, VV
    MUZICHENKO, VP
    OSTROGRADSKY, NV
    POLISHCHUK, SN
    IZVESTIYA VYSSHIKH UCHEBNYKH ZAVEDENII RADIOELEKTRONIKA, 1986, 29 (06): : 64 - 71
  • [22] Symbolic Nodal Analysis of Analog Integrated Circuits Using Pathological Elements
    Tlelo-Cuautle, E.
    Sanchez-Lopez, C.
    Tan, Sheldon X. -D.
    2012 IEEE 10TH INTERNATIONAL NEW CIRCUITS AND SYSTEMS CONFERENCE (NEWCAS), 2012, : 161 - 164
  • [23] A Platform for Placement of Analog Integrated Circuits Using Satisfiability Modulo Theories
    Saif, Sherif M.
    Dessouky, Mohamed
    El-Kharashi, M. Watheq
    Abbas, Hazem
    Nassar, Salwa
    JOURNAL OF CIRCUITS SYSTEMS AND COMPUTERS, 2016, 25 (05)
  • [24] ANALOG ELECTRONIC NEURAL NETWORK CIRCUITS
    GRAF, HP
    JACKEL, LD
    IEEE CIRCUITS AND DEVICES MAGAZINE, 1989, 5 (04): : 44 - &
  • [25] ANALOG CMOS MULTIPLIER FOR NEURAL CIRCUITS
    DEVOS, A
    DEBLEECKER, R
    DEVOS, J
    DEMEY, M
    DEMUNNYNCK, M
    INTERNATIONAL JOURNAL OF ELECTRONICS, 1992, 73 (04) : 729 - 734
  • [26] Automatic Structural Test Generation for Analog Circuits using Neural Twins
    Talukdar, Jonti
    Chaudhuri, Arjun
    Bhattacharya, Mayukh
    Chakrabarty, Krishnendu
    2022 IEEE INTERNATIONAL TEST CONFERENCE (ITC), 2022, : 145 - 154
  • [27] Fault diagnosis of analog circuits with tolerances using artificial neural networks
    Deng, Y
    He, YG
    Sun, YC
    2000 IEEE ASIA-PACIFIC CONFERENCE ON CIRCUITS AND SYSTEMS: ELECTRONIC COMMUNICATION SYSTEMS, 2000, : 292 - 295
  • [28] Learning in Memristive Neural Network Architectures Using Analog Backpropagation Circuits
    Krestinskaya, Olga
    Salama, Khaled Nabil
    James, Alex Pappachen
    IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2019, 66 (02) : 719 - 732
  • [29] AN ANALOG TEST TECHNIQUE FOR MASSIVELY-PARALLEL INTEGRATED-CIRCUITS AND SYSTEMS - AN APPROACH TO NEURAL NETWORKS CIRCUITS TESTING
    MADANI, K
    ANNALES DES TELECOMMUNICATIONS-ANNALS OF TELECOMMUNICATIONS, 1993, 48 (11-12): : 537 - 545
  • [30] MOSFET ANALOG INTEGRATED CIRCUITS - 2.
    Rehman, M.A.
    Electronic Engineering (London), 1980, 52 (646): : 75 - 83