ELECTRON-PROBE MICROANALYSIS OF ANODIC OXIDE FILMS ON ALUMINIUM ALLOYS

被引:12
|
作者
WOOD, GC
LAMBERT, BW
MARRON, VJJ
机构
关键词
D O I
10.1038/199239a0
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
引用
收藏
页码:239 / &
相关论文
共 50 条
  • [31] ELECTRON-PROBE MICROANALYSIS WITH AGAROSE COVER
    GIMELFARB, FA
    KLYOTSKINA, EV
    FILIPPOV, MN
    ALIMOVA, AN
    SUSLOV, GS
    [J]. IZVESTIYA AKADEMII NAUK SERIYA FIZICHESKAYA, 1995, 59 (02): : 64 - 69
  • [32] ELECTRON-PROBE MICROANALYSIS IN STUDY OF GALLSTONES
    BEEN, JM
    BILLS, PM
    LEWIS, D
    [J]. GUT, 1977, 18 (10) : 836 - 842
  • [33] SOME CONSIDERATIONS ON ELECTRON-PROBE MICROANALYSIS
    LEGRAND, C
    [J]. BULLETIN DE LA SOCIETE FRANCAISE DE CERAMIQUE, 1967, (75): : 81 - &
  • [34] ABSORPTION CORRECTION IN ELECTRON-PROBE MICROANALYSIS
    GABER, M
    [J]. X-RAY SPECTROMETRY, 1992, 21 (05) : 215 - 221
  • [35] RECENT PROGRESS IN ELECTRON-PROBE MICROANALYSIS
    MACKENZIE, AP
    [J]. REPORTS ON PROGRESS IN PHYSICS, 1993, 56 (04) : 557 - 604
  • [36] ELECTRON-PROBE MICROANALYSIS OF MULTILAYER STRUCTURES
    MATVIENKO, AN
    SAVIN, DO
    MAGOMEDOV, ZA
    NAZARENKO, AV
    [J]. IZVESTIYA AKADEMII NAUK SSSR SERIYA FIZICHESKAYA, 1992, 56 (03): : 132 - 137
  • [37] THICKNESS AND COMPOSITION DETERMINATION OF THIN-FILMS BY ELECTRON-PROBE MICROANALYSIS
    METCHENOV, GA
    [J]. DOKLADI NA BOLGARSKATA AKADEMIYA NA NAUKITE, 1982, 35 (02): : 171 - 174
  • [38] THE SIMULTANEOUS DETERMINATION OF THE COMPOSITION AND THICKNESS OF THE FILMS ON THE SUBSTRATE BY THE ELECTRON-PROBE MICROANALYSIS
    KAZAKOV, SV
    KONNIKOV, SG
    TRETJAKOV, VV
    [J]. IZVESTIYA AKADEMII NAUK SSSR SERIYA FIZICHESKAYA, 1991, 55 (08): : 1627 - 1631
  • [39] ELECTRON-PROBE MICROANALYSIS OF THIN-FILMS AT VARIABLE ANGLE OF INCIDENCE
    WENDT, M
    [J]. FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY, 1991, 340 (03): : 193 - 196
  • [40] CHARACTERIZATION OF DIAMOND-LIKE FILMS USING ELECTRON-PROBE MICROANALYSIS
    PIVIN, JC
    SPIRCKEL, M
    ALLOUARD, M
    RAUTUREAU, G
    [J]. APPLIED PHYSICS LETTERS, 1990, 57 (25) : 2657 - 2659