DETERMINATION OF THERMAL-EXPANSION OF PURE GE AND A MEASUREMENT OF DIFFERENTIAL THERMAL-EXPANSION OF A GE-GAAS THIN-LAYER COUPLE

被引：13

作者：

FEDER, R

LIGHT, TB

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1972年 / 43卷 / 07期

关键词：

D O I：

10.1063/1.1661668

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：3114 / &

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[11] DIFFERENTIAL THERMAL-EXPANSION IN MICROELECTRONIC SYSTEMS
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