SURFACE VIBRATIONS OF SILICON DETECTED BY LOW-ENERGY ELECTRON SPECTROSCOPY

被引：210

|

作者：

IBACH, H

机构：

来源：

PHYSICAL REVIEW LETTERS | 1971年 / 27卷 / 05期

关键词：

D O I：

10.1103/PhysRevLett.27.253

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

收藏

页码：253 / &

相关论文

共 50 条

[21] Nanostructuring at the surface of low-energy lead-implanted silicon by electron beam annealing
Markwitz, Andreas
Davy, Perry
Kennedy, John
Baumann, Horst
SURFACE AND INTERFACE ANALYSIS, 2008, 40 (05) : 931 - 934
[22] AUGER-ELECTRON SPECTROSCOPY AND ELECTRON-ENERGY LOSS SPECTROSCOPY STUDIES OF THE FORMATION OF SILICON-NITRIDE BY IMPLANTING LOW-ENERGY NITROGEN-IONS INTO SILICON
LIESKE, N
HEZEL, R
THIN SOLID FILMS, 1981, 85 (01) : 7 - 14
[23] A LOW-ENERGY ELECTRON DIFFRACTION STUDY OF EPITAXIAL SILICON LAYERS ON A GE(111) SURFACE
TAKEISHI, Y
SASAKI, I
HIRABAYASHI, K
APPLIED PHYSICS LETTERS, 1967, 11 (10) : 330 - +
[24] Modification of the surface band-bending of a silicon CCD for low-energy electron detection
Smith, AL
Yu, QM
Elliott, ST
Tombrello, TA
Nikzad, S
CONTROL OF SEMICONDUCTOR SURFACES AND INTERFACES, 1997, 448 : 177 - 183
[25] LOW-ENERGY ELECTRON-IMPACT SPECTROSCOPY ON ETHYLENE
VANVEEN, EH
CHEMICAL PHYSICS LETTERS, 1976, 41 (03) : 540 - 543
[26] Low-energy secondary-electron spectroscopy of molybdenum
O. F. Panchenko
Physics of the Solid State, 1997, 39 : 1537 - 1541
[27] Low-energy secondary-electron spectroscopy of molybdenum
Panchenko, OF
PHYSICS OF THE SOLID STATE, 1997, 39 (10) : 1537 - 1541
[28] Low-energy field emission Auger electron spectroscopy
Forsyth, N.M.
Bean, S.
Surface and Interface Analysis, 1994, 22 (01) : 338 - 341
[29] STUDIES OF ACETYLENE AND OXYGEN-ADSORPTION ON SILICON SURFACES BY LOW-ENERGY ELECTRON LOSS SPECTROSCOPY
CHUNG, YW
SIEKHAUS, W
SOMORJAI, GA
SURFACE SCIENCE, 1976, 58 (02) : 341 - 348
[30] ELECTRON-ENERGY LOSS SPECTROSCOPY FOR STUDIES OF SURFACE VIBRATIONS
IBACH, H
FROITZHEIM, H
HOPSTER, H
LEHWALD, S
NUOVO CIMENTO DELLA SOCIETA ITALIANA DI FISICA B-GENERAL PHYSICS RELATIVITY ASTRONOMY AND MATHEMATICAL PHYSICS AND METHODS, 1977, 39 (02): : 759 - 767

← 1 2 3 4 5 →