EVALUATION OF GEOMETRICAL EFFECTS IN 4 POINT PROBE MEASUREMENTS

被引：14
|
作者：
GREEN, MA
GUNN, MW
机构：
来源：
SOLID-STATE ELECTRONICS | 1971年 / 14卷 / 11期
关键词：
D O I：
10.1016/0038-1101(71)90029-3
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：1167 / &
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