OPTICS OF THIN METAL-FILMS

被引：0
|
作者：
JUENKER, DW
机构：
来源：
AMERICAN JOURNAL OF PHYSICS | 1972年 / 40卷 / 02期
关键词：
D O I：
10.1119/1.1986543
中图分类号：
G40 [教育学];
学科分类号：
040101 ; 120403 ;
摘要：
引用
收藏
页码：358 / &
相关论文
共 50 条
  • [31] ASPECTS OF OPTICAL RECORDING IN THIN METAL-FILMS
    BELL, AE
    BURKE, WJ
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1978, 68 (10) : 1418 - 1418
  • [32] THE RESOLUTION OF LASER LITHOGRAPHY ON THIN METAL-FILMS
    VEIKO, VP
    TUCHKOVA, EA
    YAKOVLEV, EB
    KVANTOVAYA ELEKTRONIKA, 1984, 11 (04): : 661 - 665
  • [33] MEASUREMENTS OF THE INTRINSIC STRESS IN THIN METAL-FILMS
    ABERMANN, R
    VACUUM, 1990, 41 (4-6) : 1279 - 1282
  • [34] THERMOELECTRIC-POWER OF THIN METAL-FILMS
    WARKUSZ, F
    ACTA PHYSICA POLONICA A, 1979, 55 (05) : 697 - 705
  • [35] DECAY OF MOLECULES AT CORRUGATED THIN METAL-FILMS
    LEUNG, PT
    KIM, YS
    GEORGE, TF
    PHYSICAL REVIEW B, 1989, 39 (14) : 9888 - 9893
  • [36] PICOSECOND TRANSIENT REFLECTANCE OF THIN METAL-FILMS
    MIKLOS, A
    BOZOKI, Z
    LORINCZ, A
    JOURNAL OF APPLIED PHYSICS, 1989, 66 (07) : 2968 - 2972
  • [37] QUANTUM SIZE EFFECTS IN THIN METAL-FILMS
    VANGELDER, AP
    PHYSICA, 1972, 59 (03): : 510 - +
  • [38] YIELD STRENGTH OF THIN METAL-FILMS ON SUBSTRATES
    KUAN, TS
    MURAKAMI, M
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1980, 25 (03): : 433 - 433
  • [39] MODELING OF LASER PLANARIZATION OF THIN METAL-FILMS
    MARELLA, PF
    TUCKERMAN, DB
    PEASE, RF
    APPLIED PHYSICS LETTERS, 1989, 54 (12) : 1109 - 1111
  • [40] PHOTOABSORPTION OF MOLECULES AT CORRUGATED THIN METAL-FILMS
    LEUNG, PT
    KIM, YS
    GEORGE, TF
    JOURNAL OF CHEMICAL PHYSICS, 1989, 90 (12): : 7472 - 7477
12345