DESIGN OF PARITY TESTABLE COMBINATIONAL-CIRCUITS

被引：6

作者：

BHATTACHARYA, BB ^{[1
]}

SETH, SC ^{[1
]}

机构：

[1] UNIV NEBRASKA,DEPT COMP SCI,LINCOLN,NE 68588

来源：

IEEE TRANSACTIONS ON COMPUTERS | 1989年 / 38卷 / 11期

关键词：

D O I：

10.1109/12.42129

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：1580 / 1584

页数：5

共 50 条

[1] SYNDROME-TESTABLE DESIGN OF COMBINATIONAL-CIRCUITS
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[10] ANALYSIS OF CYCLIC COMBINATIONAL-CIRCUITS
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