A discussion of the fundamental limit of performance of an electron microscope

被引：11
|
作者：
Hillier, J [1 ]
机构：
[1] RCA Mfg Co Inc, Res Labs, Camden, NJ USA
来源：
PHYSICAL REVIEW | 1941年 / 60卷 / 10期
关键词：
D O I：
10.1103/PhysRev.60.743
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：743 / 745
页数：3
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