A discussion of the fundamental limit of performance of an electron microscope

被引：11

|

作者：

Hillier, J ^{[1
]}

机构：

[1] RCA Mfg Co Inc, Res Labs, Camden, NJ USA

来源：

PHYSICAL REVIEW | 1941年 / 60卷 / 10期

关键词：

D O I：

10.1103/PhysRev.60.743

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

收藏

页码：743 / 745

页数：3

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