OPTIMUM DETERMINATION OF SPECKLE SIZE TO BE USED IN ELECTRONIC SPECKLE PATTERN INTERFEROMETRY

被引:18
|
作者
YOSHIMURA, T
ZHOU, M
YAMAHAI, K
LIYAN, Z
机构
[1] Department of Instrumentation Engineering, Faculty of Engineering, Kobe University, Nada, Kobe, 657, Rokko-dai
来源
APPLIED OPTICS | 1995年 / 34卷 / 01期
关键词
ELECTRONIC SPECKLE PATTERN INTERFEROMETRY; OPTIMUM CONDITION OF SPECKLE SIZE;
D O I
10.1364/AO.34.000087
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Characteristics of the fringe pattern detected by an electronic speckle pattern interferometer, in conditions in which a test object deforms in an arbitrary direction and the speckle intensity is detected over a pixel area in the TV camera to be used, have been investigated from two aspects: speckle noise reduction and fringe contrast. The main result is that the fringes are obtained with high contrast and low speckle noise, if the speckle size is selected by the optical system so as to be smaller than the pixel size. This result is applicable to highly accurate measurements of the out-of-plane displacements of the test object, whose in-plane displacement is small.
引用
收藏
页码:87 / 91
页数:5
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