PHASOMETRIC METHOD OF MEASURING THICKNESS OF TRANSPARENT RECORDERS AND BACKINGS

被引:0
|
作者
AZOVTSEV, VP
SNEZHKO, YA
机构
来源
关键词
D O I
暂无
中图分类号
TB8 [摄影技术];
学科分类号
0804 ;
摘要
引用
收藏
页码:140 / 141
页数:2
相关论文
共 50 条
  • [21] Improvement of thickness and uniformity of isotopically enriched 12C targets on backings by the HIVIPP method
    Sugai, I.
    Takeda, Y.
    Kawakami, H.
    Nagai, Y.
    Ohta, N.
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2008, 590 (1-3): : 164 - 170
  • [22] Photoacoustic method of determination of transparent film thickness
    Rykov, V.V.
    Kharionovskij, A.V.
    Pribory i Tekhnika Eksperimenta, 1992, (01): : 202 - 205
  • [23] An objective method for measuring epithelial thickness
    Arnoldussen, ME
    Somani, S
    INVESTIGATIVE OPHTHALMOLOGY & VISUAL SCIENCE, 2004, 45 : U138 - U138
  • [24] A SIMPLE NON-DESTRUCTIVE METHOD OF MEASURING THICKNESS OF TRANSPARENT THIN FILMS BETWEEN 10 AND 600 NM
    FRANZ, I
    LANGHEINRICH, W
    SOLID-STATE ELECTRONICS, 1968, 11 (01) : 59 - +
  • [25] Method for measuring the refractive index and the thickness of transparent plates with a lateral-shear, wavelength-scanning interferometer
    Coppola, G
    Ferraro, P
    Iodice, M
    De Nicola, S
    APPLIED OPTICS, 2003, 42 (19) : 3882 - 3887
  • [26] A new method for measuring bedload thickness
    Ogushwitz, PR
    Ogushwitz, HL
    SEA TECHNOLOGY, 2003, 44 (12) : 44 - +
  • [27] On a new method for measuring thickness and indices
    De Lepinay, JM
    Buisson, H
    COMPTES RENDUS HEBDOMADAIRES DES SEANCES DE L ACADEMIE DES SCIENCES, 1903, 137 : 1038 - 1040
  • [28] PHOTOTOPOGRAPHIC METHOD FOR MEASURING THE THICKNESS OF THE CORNEA
    SERGIYENKO, NM
    SOLODKY, NZ
    VESTNIK OFTALMOLOGII, 1991, (03) : 57 - 60
  • [29] Magnetic measuring method of coating thickness
    Abiline, I
    Laaneots, R
    PROCEEDINGS OF THE 2ND INTERNATIONAL CONFERENCE OF DAAAM NATIONAL ESTONIA, 2000, : 19 - 22
  • [30] A THERMOELECTRIC METHOD FOR MEASURING THICKNESS OF ELECTROPLATINGS
    SUVOROV, LM
    INDUSTRIAL LABORATORY, 1965, 30 (08): : 1185 - &