IMAGING OF TILT GRAIN-BOUNDARIES IN THIN SILVER FILMS BY SCANNING REFLECTION ELECTRON-MICROSCOPY

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作者：

CASTANO, VM

HERNANDEZ, R

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JOURNAL OF MATERIALS SCIENCE LETTERS | 1989年 / 8卷 / 01期

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D O I：

10.1007/BF00720240

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T [工业技术];

学科分类号：

08 ;

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页码：21 / 23

页数：3

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