IMAGING OF TILT GRAIN-BOUNDARIES IN THIN SILVER FILMS BY SCANNING REFLECTION ELECTRON-MICROSCOPY

被引：0

作者：

CASTANO, VM

HERNANDEZ, R

机构：

来源：

JOURNAL OF MATERIALS SCIENCE LETTERS | 1989年 / 8卷 / 01期

关键词：

D O I：

10.1007/BF00720240

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：21 / 23

页数：3

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[1] EBIC SCANNING ELECTRON-MICROSCOPY AND TRANSMISSION ELECTRON-MICROSCOPY OF SILICON GRAIN-BOUNDARIES
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