ANALYSIS OF MULTIPLY CENSORED RUN-IN DATA

被引：0
|
作者：
ELERATH, J
机构：
来源：
PROCEEDINGS ANNUAL RELIABILITY AND MAINTAINABILITY SYMPOSIUM | 1990年 / SYM期
关键词：
HAZARD ANALYSIS; WEIBULL DISTRIBUTION; SYSTEM TEST; BURN-IN; DATA ANALYSIS;
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Test data from burn-in of complex electromechanical systems were analyzed using hazard plots. A BASIC computer code generated plots of multiply censored data for five common distributions to determine the best fit. The effects of burn-in at the module level can be seen at the system level using the three-parameter Weibull distribution. A "bath tub" curve was generated for presentation purposes.
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页码：501 / 506
页数：6
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