THE EFFECT OF GLASS FRITS ON THE MICROSTRUCTURE AND ELECTRICAL-PROPERTIES OF BISMUTH RUTHENATE THICK-FILM RESISTORS

被引：0
|
作者：
NAM, SH
KIM, HG
机构：
[1] Korea Advanced Inst of Science and, Technology, Seoul, Korea, Republic of
来源：
THIN SOLID FILMS | 1991年 / 195卷 / 1-2期
关键词：
D O I：
10.1016/0040-6090(91)90257-X
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
A resistor system consisting of bismuth ruthenate and glass frits is used to study the effect of glass frits on the microstructure development and electrical properties of resistors which have different compositions and different softening points. As the glass content increases, the sheet resistance of the resistor films increases, which is significant in glass of low softening point. When the firing temperature is varied from 650-degrees-C to 950-degrees-C, the resistance decreases with increasing temperature. The temperature dependence of the resistance turns from negative to positive values with increasing firing temperature. Finally, it is shown that the microstructure of the film influences the electrical properties of the thick film.
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页码：43 / 51
页数：9
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