HIGH-SENSITIVITY OPTICAL INTERFEROMETERS FOR PLASMA DIAGNOSTICS

被引：0
|
作者：
YASUDA, A [1 ]
TAKEDA, S [1 ]
机构：
[1] NAGOYA UNIV,DEPT ELECT ENGN,NAGOYA,JAPAN
来源：
ELECTRICAL ENGINEERING IN JAPAN | 1972年 / 92卷 / 06期
关键词：
D O I：
10.1002/eej.4390920621
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：150 / 157
页数：8
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