DIGITAL PHASE MEASURING FIZEAU INTERFEROMETER FOR TESTING OF FLAT AND SPHERICAL SURFACES

被引：0
|
作者：
CHEN, J
MURATA, K
机构：
来源：
OPTIK | 1988年 / 81卷 / 01期
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D O I：
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中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
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页码：28 / 32
页数：5
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