REFLECTION CORRECTION FOR HIGH-ACCURACY TRANSMITTANCE MEASUREMENTS ON FILTER GLASSES

被引：7
|
作者：
MIELENZ, KD [1 ]
MAVRODINEANU, R [1 ]
机构：
[1] NBS, INST MAT RES, WASHINGTON, DC 20234 USA
来源：
JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS SECTION A-PHYSICS AND CHEMISTRY | 1973年 / A 77卷 / 06期
关键词：
LIGHT; -; Reflection;
D O I：
10.6028/jres.077A.041
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
Multiple reflections in the sample compartment of a spectrophotometer constitute a source of systematic bias in transmittance measurements on filter glasses. This bias may be removed by applying a numerical correction obtained from measurements on tilted samples in polarized light. For a high-accuracy spectrophotometer, this correction was found to be of the order of several 10** minus **4 transmittance units, independent of polarization, but slightly wavelength dependent.
引用
收藏
页码：699 / 703
页数：5
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