AN ATOMIC-RESOLUTION ATOMIC-FORCE MICROSCOPE IMPLEMENTED USING AN OPTICAL-LEVER

被引：509
|
作者：
ALEXANDER, S [1 ]
HELLEMANS, L [1 ]
MARTI, O [1 ]
SCHNEIR, J [1 ]
ELINGS, V [1 ]
HANSMA, PK [1 ]
LONGMIRE, M [1 ]
GURLEY, J [1 ]
机构：
[1] DIGITIAL INSTRUMENTS INC,SANTA BARBARA,CA 93110
来源：
JOURNAL OF APPLIED PHYSICS | 1989年 / 65卷 / 01期
关键词：
D O I：
10.1063/1.342563
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：164 / 167
页数：4
相关论文
共 50 条
  • [1] A NEW, OPTICAL-LEVER BASED ATOMIC-FORCE MICROSCOPE
    HANSMA, PK
    DRAKE, B
    GRIGG, D
    PRATER, CB
    YASHAR, F
    GURLEY, G
    ELING, SV
    FEINSTEIN, S
    LAL, R
    [J]. JOURNAL OF APPLIED PHYSICS, 1994, 76 (02) : 796 - 799
  • [2] New, optical-lever based atomic force microscope
    [J]. Hansma, P.K, 1600, American Inst of Physics, Woodbury, NY, United States (76):
  • [3] CALIBRATION OF OPTICAL-LEVER SENSITIVITY FOR ATOMIC-FORCE MICROSCOPY
    DCOSTA, NP
    HOH, JH
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1995, 66 (10): : 5096 - 5097
  • [4] DIFFERENCE BETWEEN THE FORCES MEASURED BY AN OPTICAL-LEVER DEFLECTION AND BY OPTICAL INTERFEROMETER IN AN ATOMIC-FORCE MICROSCOPE
    FUJISAWA, S
    OHTA, M
    KONISHI, T
    SUGAWARA, Y
    MORITA, S
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1994, 65 (03): : 644 - 647
  • [5] HEIGHT CALIBRATION OF OPTICAL-LEVER ATOMIC-FORCE MICROSCOPES BY SIMPLE LASER INTERFEROMETRY
    JASCHKE, M
    BUTT, HJ
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1995, 66 (02): : 1258 - 1259
  • [6] INTERPRETATIONS OF ATOMIC-RESOLUTION IMAGES IN ATOMIC-FORCE MICROSCOPY
    XU, L
    YAO, XW
    ZHANG, LP
    LI, MQ
    YANG, FJ
    [J]. PHYSICAL REVIEW B, 1995, 51 (15): : 10013 - 10016
  • [7] Optical lever calibration in atomic force microscope with a mechanical lever
    Xie, Hui
    Vitard, Julien
    Haliyo, Sinan
    Regnier, Stephane
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 2008, 79 (09):
  • [8] ATOMIC-RESOLUTION ELECTROCHEMISTRY WITH THE ATOMIC FORCE MICROSCOPE - COPPER DEPOSITION ON GOLD
    MANNE, S
    HANSMA, PK
    MASSIE, J
    ELINGS, VB
    GEWIRTH, AA
    [J]. SCIENCE, 1991, 251 (4990) : 183 - 186
  • [9] ATOMIC-FORCE MICROSCOPY AND REAL ATOMIC-RESOLUTION - SIMPLE COMPUTER-SIMULATIONS
    KOUTSOS, V
    MANIAS, E
    TENBRINKE, G
    HADZIIOANNOU, G
    [J]. EUROPHYSICS LETTERS, 1994, 26 (02): : 103 - 107
  • [10] OPTICAL READING AND WRITING ON GAAS USING AN ATOMIC-FORCE MICROSCOPE
    CHRISTENSON, GL
    MILLER, SA
    ZHU, ZH
    MACDONALD, NC
    LO, YH
    [J]. APPLIED PHYSICS LETTERS, 1995, 66 (21) : 2780 - 2782
12345